| Name |
Takuji TAKAHASHI |
Present
Status |
Associate Professor,
Institute of Industrial Science (IIS),
University of Tokyo |
| Degree |
Doctor of Engineering |
| Biography |
|
Research
Area |
Nano-probing Technologies using Scanning Probe Microscopes
- Scanning Prove Microscopy (SPM) under Laser Irradiation
- Electrostatic Force Measurements by Atomic Force Microscopy
(AFM) with a Conductice Tip
- Surface Potential Measurements on Semiconductors by Kelvin
Probe Force Microscopy (KFM)
- Non-contact and Local Current Detection by Magnetic Force Microscopy (MFM)
- Development of Novel Methods for Scanning Tunneling Spectroscopy
- Development of a novel STM using Semiconductor Tips
(Publication List)
|
|
Lectures |
- Graduate Course (Electronics):
Fundamentals of Semiconductor Devices.
- Graduate Course (Advanced Interdisciplinary Studies):
Introduction to Semiconductor Physics
|
| Academic Societies |
- Japan Society of Applied Physics (JSAP)
- The Institute of Electronics, Information and Communication Engineers (IEICE)
- The Institute of Electrical Engineers of Japan
|